Number: 2015838
Country: United Kingdom
Source: TED
UCAM 003/17 — For the provision of a visible-IR scanning probe microscopy system (vis-IR-SPM).
The department of Physics requires a visible-IR scanning probe microscopy system (vis-IR-SPM) more fully described in Section 3 of this tender.
Broadly, we require:
— An open reconfigurable scanning probe system, so scanning stage can be moved to any other microscope.
— Capable of combining with existing Renishaw Raman spectroscopy (Invia) system (fitted by us with suitable podule).
— With switchable heads for both laser and tuning fork AFM detection, and STM detection modes.
— With probe tips that can be transparent in any configuration, including mid-IR.
— With magnetic field up to 1T that can be locally applied both in-plane and out-of-plane.
— With access simultaneously with mid-IR lasers (via off-axis paraboloid mirror) and visible lasers (via x50 objective, which can be water immersion), with no occlusion of beams.
The Department of Physics requires a visible-IR scanning probe microscopy system (vis-IR-SPM) more fully described in Section 3 of this tender.
The Department requires
— With Switchable heads for both laser and tuning fork AFM detection, and STM detection modes.
Visible-IR scanning probe microscopy system (vis-IR-SPM)
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